Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.
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| Main Author: | |
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| Corporate Authors: | , |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Wiley,
[1975]
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| Subjects: |
PASCAL Offsite
| Call Number: |
QH212.E4 S53 1975
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| QH212.E4 S53 1975 | Available Place a Hold |