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Compositional imaging of semiconductor interfaces by Z-contrast scanning transmission electron microscope (STEM) [electronic resource]

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Bibliographic Details
Online Access:	Full Text (via OSTI)
Corporate Authors:	Oak Ridge National Laboratory (Researcher), Historical Energy Database (United States)
Format:	Government Document Electronic eBook
Language:	English
Published:	Oak Ridge, Tenn. : Oak Ridge, Tenn. : Oak Ridge National Laboratory ; Distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 1990.
Subjects:	36 materials science Interfaces Electron microscopy Semiconductor materials Crystal structure Gallium arsenides Gallium compounds Germanium silicides Indium compounds Superlattices Et al Materials science

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Call Number:	E 1.99:CONF-901105-11
E 1.99:CONF-901105-11	Available