System dependability and analytics : approaching system dependability from data, system and analytics perspectives / Long Wang, Karthik Pattabiraman, Catello Di Martino, Arjun Athreya, Saurabh Bagchi, editors.

"This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Other Authors:	Wang, Long (Editor), Pattabiraman, Karthik (Editor), Di Martino, Catello (Editor), Athreya, Arjun (Editor), Bagchi, Saurabh (Editor), Iyer, Ravishankar K. (honouree.)
Format:	eBook
Language:	English
Published:	Cham, Switzerland : Springer, 2023.
Series:	Springer series in reliability engineering.
Subjects:	Reliability (Engineering) > Statistical methods.