Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
Saved in:
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
©1985.
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| Series: | Springer series in optical sciences ;
v. 45. |
| Subjects: |
Norlin Library - Science Stacks
| Call Number: |
QH212.S3 R452 1985
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| QH212.S3 R452 1985 | Available Place a Hold |