Stereology and morphometry in electron microscopy : problems and solutions / edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Edward R. Weibel.

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Bibliographic Details
Other Authors:	Reith, Albrecht, Mayhew, Terry M.
Format:	Book
Language:	English
Published:	New York : Hemisphere Pub. Corp., ©1988.
Series:	Ultrastructural pathology publication series.
Subjects:	Electron microscopy > Technique. Stereology.

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Holdings details from PASCAL Offsite
Call Number:	RB43.5 .S74 1988
RB43.5 .S74 1988	Available Place a Hold