Optically based methods for process analysis : 23-26 March 1992, Somerset, New Jersey / David S. Bomse [and others], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, Fiber Optics Materials Research Program/Rutgers University, New Jersey Commission on Science and Technology.
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| Corporate Authors: | , , |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©1992.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1681. |
| Subjects: |
PASCAL Offsite
| Call Number: |
TS156.2 .O656 1992
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| TS156.2 .O656 1992 | Available Place a Hold |