Self-testing VLSI design / V.N. Yarmolik, I.V. Kachan.

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Bibliographic Details
Main Author:	I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich)
Other Authors:	Kachan, I. V.
Format:	Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1993.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design.

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Holdings details from PASCAL Offsite
Call Number:	TK7874 .I16 1993
TK7874 .I16 1993	Available Place a Hold