Diffractometry and scatterometry : 24-28 May 1993 / Maksymilian Pluta, Mariusz Szyjer, chairs/editors ; organized by SPIE Poland Chapter, Institute of Applied Optics, Warsaw.
Saved in:
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©1994.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1991. |
| Subjects: |
| Physical Description: | xvi, 268 pages : illustrations, portraits ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and indexes. |
| ISBN: | 0819412406 |
| Action Note: | committed to retain 20230101 20480101 Alliance Shared Trust https://www.coalliance.org/shared-print-archiving-policies. |