Absolute specular reflectometer with an autocollimator telescope and auxiliary mirrors [microform] / Tie Ming Wang, Kenneth L. Eckerle, Jack J. Hsia.

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Bibliographic Details
Main Author:	Wang, Tie Ming
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Eckerle, Kenneth L., Hsia, J. J.
Format:	Government Document Microfilm Book
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Series:	NIST technical note ; 1280.
Subjects:	Specular reflectance > Measurement. Reflecting telescopes > Calibration.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	C 13.46:1280
C 13.46:1280	Restricted Place a Hold