Static tests of one-third scale impact limiters [microform] / Long T. Phan and H.S. Lew.

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Bibliographic Details
Main Author:	Phan, Long T. (Long Thanh), 1958-
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Lew, H. S. (Hai Sang)
Other title:	Static tests of one third scale impact limiters.
Format:	Government Document Microfilm Book
Language:	English
Published:	[Gaithersburg, MD] : [Springfield, VA] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], [1989]
Series:	NISTIR ; 4089.
Subjects:	Cushioning materials > Testing. Strains and stresses > Testing.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	C 13.58:89-4089
C 13.58:89-4089	Restricted Place a Hold