Version 2.0 of the TXYZ thermal analysis program, TXYZ20 [microform] / John Albers.

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Bibliographic Details
Main Author:	Albers, John
Corporate Author:	National Institute of Standards and Technology (U.S.)
Format:	Government Document Microfilm Book
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Series:	Semiconductor measurement technology. NIST special publication ; 400-89.
Subjects:	Semiconductors > Thermal properties. Thermal analysis > Computer programs.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	C 13.10:400-89
C 13.10:400-89	Restricted Place a Hold