Semiconductor measurement technology [microform] : evolution of silicon materials characterization : lessons learned for improved manufacturing / W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology"

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Bibliographic Details
Main Author: Bullis, W. Murray, 1930-
Corporate Author: National Institute of Standards and Technology (U.S.). Semiconductor Electronics Division
Other title:Evolution of silicon materials characteristics, lessons learned for improved manufacturing.
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : Washington, D.C. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; For sale by the Supt. of Docs., U.S. G.P.O., 1993.
Series:NIST special publication ; 400-92.
Subjects:

MARC

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100 1 |a Bullis, W. Murray,  |d 1930-  |0 http://id.loc.gov/authorities/names/n80090215  |1 http://isni.org/isni/0000000080941222. 
245 1 0 |a Semiconductor measurement technology  |h [microform] :  |b evolution of silicon materials characterization : lessons learned for improved manufacturing /  |c W. Murray Bullis ; prepared for Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology" 
260 |a Gaithersburg, MD :  |b U.S. Dept. of Commerce, National Institute of Standards and Technology ;  |a Washington, D.C. :  |b For sale by the Supt. of Docs., U.S. G.P.O.,  |c 1993. 
300 |a iv, 27, 201-211 pages :  |b illustrations ;  |c 28 cm. 
336 |a text  |b txt  |2 rdacontent. 
337 |a microform  |b h  |2 rdamedia. 
338 |a microfiche  |b he  |2 rdacarrier. 
490 1 |a NIST special publication ;  |v 400-92. 
500 |a Distributed to depository libraries in microfiche. 
500 |a Shipping list number: 94-0057-P. 
500 |a Paper version no longer for sale by the Supt. of Docs. 
500 |a "July 1993." 
504 |a Includes bibliographical references (pages 23-25) 
533 |a Microfiche.  |b [Washington, D.C.?] :  |c Supt. of Docs., U.S. G.P.O.,  |d [1994]  |e 1 microfiche : negative. 
650 0 |a Semiconductors.  |0 http://id.loc.gov/authorities/subjects/sh85119903. 
650 0 |a Semiconductor wafers.  |0 http://id.loc.gov/authorities/subjects/sh85119902. 
650 0 |a Integrated circuits  |x Wafer-scale integration  |z United States. 
710 2 |a National Institute of Standards and Technology (U.S.).  |b Semiconductor Electronics Division.  |0 http://id.loc.gov/authorities/names/no90015380. 
740 0 |a Evolution of silicon materials characteristics, lessons learned for improved manufacturing. 
830 0 |a NIST special publication ;  |v 400-92.  |0 http://id.loc.gov/authorities/names/n88507958. 
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