Electrical properties of materials for elevated temperature resistance strain gage application [microform] / by Jih-Fen Lei.

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Bibliographic Details
Main Author:	Lei, Jih-Fen
Corporate Author:	United States. National Aeronautics and Space Administration
Format:	Government Document Microfilm Book
Language:	English
Published:	Evanston, Ill. : [Washington, D.C.] : [Springfield, Va.] : Technological Institute, Northwestern University ; [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], [1988]
Series:	NASA contractor report ; NASA CR-182214.
Subjects:	Boron carbides. Electrical resistance. High temperature. Silicon carbides. Strain gages. Titanium. Zirconium.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.26:182214
NAS 1.26:182214	Restricted Place a Hold