Measurement-based reliability/performability models [microform] / by Mei-Chen Hsueh.

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Bibliographic Details
Main Author:	Hsueh, Mei-Chen
Corporate Author:	Langley Research Center
Other title:	Measurement based reliability performability models.
Format:	Government Document Thesis Microfilm Book
Language:	English
Published:	[Hampton, VA] : [Springfield, Va.] : [Langley Research Ctr.] ; [National Technical Information Service, distributor], [1987]
Series:	NASA contractor report ; NASA CR-181299.
Subjects:	Error analysis. Failure analysis. Markov processes. Mathematical models. Multiprocessing (Computers) Program verification (Computers) Software engineering.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.26:181299
NAS 1.26:181299	Restricted Place a Hold