Separation of crack extension modes in orthotropic delamination models [microform] / Jack L. Beuth.

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Bibliographic Details
Main Author: Beuth, Jack L.
Corporate Author: Langley Research Center
Format: Government Document Microfilm Book
Language:English
Published: Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1995]
Series:NASA technical memorandum ; 109180.
Subjects:

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: NAS 1.15:109180
NAS 1.15:109180 Restricted Place a Hold