A simple method of obtaining concentration depth-profiles from X-ray diffraction [microform] / by K.E. Wiedemann, J. Unnam.

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Bibliographic Details
Main Author:	Wiedemann, K. E.
Corporate Author:	United States. National Aeronautics and Space Administration
Other Authors:	Unnam, Jalaiah
Format:	Government Document Microfilm Book
Language:	English
Published:	Warrendale, PA : [Washington, DC] : [Springfield, Va.] : Metallurgical Society of AIME ; [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor], [1984]
Series:	NASA contractor report ; NASA CR-176262. TMS paper selection ; paper no. F84-15.
Subjects:	Convolution integrals. Depth measurement. Diffraction patterns. Luminous intensity. X ray diffraction.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.26:176262
NAS 1.26:176262	Restricted Place a Hold