A simple method of obtaining concentration depth-profiles from X-ray diffraction [microform] / by K.E. Wiedemann, J. Unnam.
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| Main Author: | |
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| Corporate Author: | |
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| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
Warrendale, PA : [Washington, DC] : [Springfield, Va.] :
Metallurgical Society of AIME ; [National Aeronautics and Space Administration] ; [National Technical Information Service, distributor],
[1984]
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| Series: | NASA contractor report ;
NASA CR-176262. TMS paper selection ; paper no. F84-15. |
| Subjects: |
MARC
| LEADER | 00000nam a22000007a 4500 | ||
|---|---|---|---|
| 001 | b2521368 | ||
| 003 | CoU | ||
| 005 | 19951107100947.0 | ||
| 007 | he |||||||||| | ||
| 008 | 951107s1984 pau b f000 0 eng d | ||
| 035 | |a (OCoLC)ocm33431336 | ||
| 035 | |a (GPO)96055304 | ||
| 037 | |a N 86-10310 |b NASA | ||
| 040 | |a GPO |c GPO |d DLC |d MvI | ||
| 049 | |a COD9 | ||
| 074 | |a 0830-H-14 (MF) | ||
| 086 | 0 | |a NAS 1.26:176262 | |
| 086 | 0 | |a NAS 1.26:176262 | |
| 100 | 1 | |a Wiedemann, K. E. | |
| 245 | 1 | 2 | |a A simple method of obtaining concentration depth-profiles from X-ray diffraction |h [microform] / |c by K.E. Wiedemann, J. Unnam. |
| 260 | |a Warrendale, PA : |b Metallurgical Society of AIME ; |a [Washington, DC] : |b [National Aeronautics and Space Administration] ; |a [Springfield, Va.] : |b [National Technical Information Service, distributor], |c [1984] | ||
| 300 | |a 1 volume. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a microform |b h |2 rdamedia. | ||
| 338 | |a microfiche |b he |2 rdacarrier. | ||
| 490 | 1 | |a [NASA contractor report] ; |v NASA CR-176262. | |
| 490 | 1 | |a TMS paper selection ; |v paper no. F84-15. | |
| 500 | |a Distributed to depository libraries in microfiche. | ||
| 533 | |a Microfiche. |b [Washington, D.C. : |c National Aeronautics and Space Administration, |d 1986] |e 1 microfiche. | ||
| 650 | 7 | |a Convolution integrals. |2 nasat. | |
| 650 | 7 | |a Depth measurement. |2 nasat. | |
| 650 | 7 | |a Diffraction patterns. |2 nasat. | |
| 650 | 7 | |a Luminous intensity. |2 nasat. | |
| 650 | 7 | |a X ray diffraction. |2 nasat. | |
| 650 | 0 | |a Diffraction patterns. |0 http://id.loc.gov/authorities/subjects/sh85037932. | |
| 700 | 1 | |a Unnam, Jalaiah. |0 http://id.loc.gov/authorities/names/n83016171 |1 http://isni.org/isni/0000000023556037. | |
| 710 | 1 | |a United States. |b National Aeronautics and Space Administration. |0 http://id.loc.gov/authorities/names/n78087581 |1 http://isni.org/isni/0000000449071619. | |
| 830 | 0 | |a NASA contractor report ; |v NASA CR-176262. |0 http://id.loc.gov/authorities/names/n83825229. | |
| 830 | 0 | |a TMS paper selection ; |v paper no. F84-15. | |
| 907 | |a .b25213684 |b 03-18-20 |c 02-07-96 | ||
| 998 | |a gov |b 02-07-96 |c - |d m |e - |f eng |g pau |h 2 |i 1 | ||
| 907 | |a .b25213684 |b 05-09-19 |c 02-07-96 | ||
| 944 | |a MARS - RDA ENRICHED | ||
| 907 | |a .b25213684 |b 01-13-09 |c 02-07-96 | ||
| 907 | |a .b25213684 |b 06-25-04 |c 02-07-96 | ||
| 999 | f | f | |i b3b795d0-61e8-5066-8ac1-9960357c245e |s ff29d4f9-d3f7-5bc2-b793-9388d46c6fe9 |
| 952 | f | f | |p Can circulate |a University of Colorado Boulder |b Boulder Campus |c Norlin |d Norlin Library - Government Information - Microform |e NAS 1.26:176262 |h Superintendent of Documents classification |i document |n 1 |