Recent advances in the measurement of anxiety, neuroticism, and the psychotic syndromes / by Raymond Cattell, Ivan H. Scheier, Maurice Lorr.
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Other Authors: | , |
Format: | Book |
Language: | English |
Published: |
New York :
The Academy,
1962.
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Series: | Annals of the New York Academy of Sciences ;
v. 93, art. 20. |
Subjects: |