Failure analysis of integrated circuits : tools and techniques / edited by Lawrence C. Wagner.

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Bibliographic Details
Other Authors:	Wagner, Lawrence C.
Format:	Book
Language:	English
Published:	Boston, Mass. : Kluwer Academic Publishers, ©1999.
Subjects:	Semiconductors > Failures. Integrated circuits > Testing. Integrated circuits > Reliability.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	TK7871.852 .F35 1999
TK7871.852 .F35 1999	Withdrawn