Software quality lessons from medical device failure data [microform] / Dolores R. Wallace, D. Richard Kuhn.

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Bibliographic Details
Main Author: Wallace, Dolores R.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Kuhn, D. Richard
Format: Government Document Microfilm Book
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999]
Series:NISTIR ; 6407.
Subjects:

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: C 13.58:6407
C 13.58:6407 Restricted Place a Hold