Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.

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Bibliographic Details
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Main Author:	Tripp, John S.
Corporate Author:	Langley Research Center
Other Authors:	Tcheng, Ping
Format:	Government Document Microfilm Book
Language:	English
Published:	Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1999]
Series:	NASA technical paper ; 209545.
Subjects:	Bias. Precision. Errors. Calibrating.

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Holdings details from Online
Call Number:	NAS 1.60:209545
NAS 1.60:209545	Available

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.60:209545
NAS 1.60:209545	Restricted Place a Hold