Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.

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Bibliographic Details
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Main Author: Tripp, John S.
Corporate Author: Langley Research Center
Other Authors: Tcheng, Ping
Format: Government Document Microfilm Book
Language:English
Published: Hampton, Va. : [Springfield, Va.] : National Aeronautics and Space Administration, Langley Research Center ; [National Technical Information Service, distributor], [1999]
Series:NASA technical paper ; 209545.
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Description
Item Description:Shipping list number: 2000-0278-M.
Physical Description:1 volume.
Reproduction Note:Microfiche.