Optical systems contamination and degradation II : effects, measurements, and control : 2-3 August 2000, San Diego, USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Saved in:
| Corporate Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©2000.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4096. |
| Subjects: |
Closed Stacks - Engineering Math & Physics Library - Stacks
| Call Number: |
TL946 .O79 2000
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| TL946 .O79 2000 | Available Place a Hold |