Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA / David L. Andrews [and others] ; sponsored ... by SPIE--the International Society for Optical Engineering.
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©2000.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4098. |
| Subjects: |
PASCAL Offsite
| Call Number: |
TA418.9.N35 O66 2000
|
|---|---|
| TA418.9.N35 O66 2000 | Available Place a Hold |