X-ray tomography in material science / edited by José Baruchel[and others]

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Bibliographic Details
Other Authors:	Baruchel, José
Format:	Book
Language:	English
Published:	Paris : Hermes Science, ©2000.
Subjects:	Radiography, Industrial > Congresses. Materials > Testing > Congresses. X-rays > Industrial applications > Congresses. Tomography > Congresses.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	TA417.25 .X8 2000
TA417.25 .X8 2000	Missing Place a Hold