Semiconductor device and failue analysis : using photon emission microscopy / Wai Kin Chim.

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Bibliographic Details
Main Author:	Chim, Wai Kin
Format:	Book
Language:	English
Published:	Chichester, [England] ; New York : John Wiley, ©2000.
Subjects:	Semiconductors > Failures. Semiconductors > Testing. Semiconductors > Microscopy. Photon emission.

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Holdings details from PASCAL Offsite
Call Number:	TK7871.852 .C47 2000
TK7871.852 .C47 2000	Available Place a Hold