Remote measurement of ice thickness on the shuttle external tank surface [microform] / Jag J. Singh.
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| Main Author: | |
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| Corporate Author: | |
| Format: | Government Document Microfilm Book |
| Language: | English |
| Published: |
Hampton, Va. : [Springfield, Va.] :
National Aeronautics and Space Administration, Langley Research Center ; [For sale by the National Technical Informaion Service],
[1990]
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| Series: | NASA technical memorandum ;
102667. |
| Subjects: |
Internet
Request from Rare and Distinctive CollectionsNorlin Library - Government Information - Microform
| Call Number: |
NAS 1.15:102667
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| NAS 1.15:102667 | Restricted Place a Hold |