Metrology for radio frequency technology [microform] : a bibliography of NIST publications.

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Bibliographic Details
Corporate Author:	National Institute of Standards and Technology (U.S.)
Format:	Government Document Microfilm Serial
Language:	English
Published:	Boulder, CO : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology.
Series:	NISTIR.
Subjects:	National Institute of Standards and Technology (U.S.) > Bibliography > Periodicals. Radio frequency > Bibliography > Periodicals. Radio measurements > Bibliography > Periodicals.

Norlin Library - Government Information - Microform