Frequency domain analysis of the random loading of cracked panels [microform]/ James F. Doyle.

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Bibliographic Details
Main Author: Doyle, James F., 1951-
Corporate Author: United States. National Aeronautics and Space Administration
Format: Government Document Book
Series:NASA contractor report ; NASA CR-196021.
Subjects:

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number: NAS 1.26:196021
NAS 1.26:196021 Restricted Place a Hold