Power-constrained testing of VLSI circuits / by Nicola Nicolici and Bashir M. Al-Hashimi.

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Bibliographic Details
Main Author:	Nicolici, Nicola
Other Authors:	Al-Hashimi, Bashir
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, ©2003.
Series:	Frontiers in electronic testing ; 22.
Subjects:	Integrated circuits, Very large scale integration > Testing. Integrated circuits, Very large scale integration > Protection. Semiconductors > Thermal properties.

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Holdings details from PASCAL Offsite
Call Number:	TK7874.75 .N53 2003
TK7874.75 .N53 2003	Available Place a Hold