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Detecting a change in school performance [microform] : a Bayesian analysis for a multilevel join point problem / Yeow Meng Thum, Suman Kumar Bhattacharya.

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Bibliographic Details
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Main Author:	Thum, Yeow Meng
Corporate Author:	Educational Resources Information Center (U.S.)
Other Authors:	Bhattacharya, Suman Kumar
Other title:	Bayesian analysis for a multilevel join point problem.
Format:	Government Document Microfilm Book
Language:	English
Published:	Los Angeles, CA : [Washington, DC] : Center for the Study of Evaluation, National Center for Research on Evaluation, Standards, and Student Testing, Graduate School of Education & Information Studies, University of California, Los Angeles ; U.S. Dept. of Education, Office of Educational Research and Improvement, Educational Resources Information Center, [2001]
Series:	CSE report ; no. 542.
Subjects:	Educational change > Mathematical models. School improvement programs > Mathematical models.

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Call Number:	ED 1.310/2:456153
ED 1.310/2:456153	Available Place a Hold