Optical devices and diagnostics in materials science [electronic resource] : 1-4 August 2000, San Diego, USA / David L. Andrews [and others] ; sponsored ... by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors:	Andrews, David L.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©2000.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4098.
Subjects:	Nanostructured materials > Testing > Congresses. Optical materials > Testing > Congresses. Optoelectronic devices > Congresses. Light > Scattering > Congresses. Near-field microscopy > Industrial applications > Congresses. Raman spectroscopy > Industrial applications > Congresses.

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Call Number:	TA418.9.N35 O388 2000
TA418.9.N35 O388 2000	Available