Scattering and surface roughness III [electronic resource] : 1-2 August 2000, San Diego, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors:	Gu, Zu-Han, Maradudin, Alexei A., 1931-
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©2000.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4100.
Subjects:	Surface roughness > Measurement > Congresses. Light > Scattering > Congresses. Electromagnetic waves > Scattering > Congresses. Electromagnetic waves > Scattering. Light > Scattering. Surface roughness > Measurement. Conference papers and proceedings.

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Call Number:	TA418.7 .S33 2000
TA418.7 .S33 2000	Available