Ultraviolet and X-ray detection, spectroscopy, and polarimetry III [electronic resource] : 19-20 July 1999, Denver, Colorado / Silvano Fineschi, Bruce E. Woodgate, Randy A. Kimble, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, SPIE Digital Library
Other Authors:	Fineschi, Silvano, Woodgate, Bruce, Kimble, Randy A. (Randy Alan)
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©1999.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3764.
Subjects:	Polarimetry > Congresses. X-ray astronomy > Instruments > Congresses. Ultraviolet astronomy > Instruments > Congresses. Ultraviolet detectors > Congresses. Polarimetry. Ultraviolet astronomy > Instruments. Ultraviolet detectors. X-ray astronomy > Instruments. Conference papers and proceedings.

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Holdings details from Online
Call Number:	QB468 .U48 1999
QB468 .U48 1999	Available