Testing, packaging, reliability, and applications of semiconductor lasers IV [electronic resource] / Mahmoud Fallahi, Kurt J. Linden, S.C. Wang.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library) Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV -- SPIE Digital Library - Conference Proceedings
Corporate Author:	SPIE Digital Library
Other Authors:	Fallahi, Mahmoud, Linden, Kurt J., Wang, S. C. (Shing Chung), 1934-
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©1999.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3626.
Subjects:	Semiconductor lasers > Congresses. Semiconductor lasers. Conference papers and proceedings.

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