Surface characterization for computer disks, wafers, and flat panel displays [electronic resource] : 28 January 1999, San Jose, California / John C. Stover, chair/editor.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE Digital Library
Other Authors:	Stover, John C.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©1999.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3619.
Subjects:	Data disk drives > Congresses. Surfaces (Technology) > Congresses. Semiconductor wafers > Congresses. Electroluminescent display systems > Congresses. Data disk drives. Electroluminescent display systems. Semiconductor wafers. Surfaces (Technology) Conference papers and proceedings.

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Call Number:	TK7887.8.D37 S87 1999
TK7887.8.D37 S87 1999	Available