Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing [electronic resource] : 30-31 July 2001, San Diego, USA / Émile J. Knystautas, Wiley P. Kirk, Valerie Browning, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
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Full Text (via SPIE Digital Library) |
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Corporate Authors: | , |
Other Authors: | , , |
Format: | Electronic eBook |
Language: | English |
Published: |
Bellingham, Wash., USA :
SPIE,
©2001.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4468. |
Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
Call Number: |
TA418.9.T45 E54 2001
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TA418.9.T45 E54 2001 | Available |