Surface scattering and diffraction for advanced metrology II [electronic resource] : 9 July, 2002, Seattle, Washington, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company [and others]

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, Boeing Company, SPIE Digital Library
Other Authors:	Gu, Zu-Han, Maradudin, Alexei A., 1931-
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2002.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4780.
Subjects:	Surface roughness > Measurement > Congresses. Diffractive scattering > Congresses. Optical measurements > Congresses. Scattering (Physics) > Congresses. Metrology > Congresses. Diffractive scattering. Metrology. Optical measurements. Scattering (Physics) Surface roughness > Measurement. Conference papers and proceedings.

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Call Number:	TA418.7 .S922 2002
TA418.7 .S922 2002	Available