Polarization: measurement, analysis, and remote sensing VI [electronic resource] : 15 April 2004, Orlando, Florida, USA / Dennis H. Goldstein, David B. Chenault, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
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Corporate Authors: | , |
Other Authors: | , |
Other title: | Measurement, analysis, and remote sensing VI. Polarization: measurement, analysis and applications. |
Format: | Electronic eBook |
Language: | English |
Published: |
Bellingham, Wash. :
SPIE,
©2004.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5432. |
Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
Call Number: |
QC440 .P624 2004
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QC440 .P624 2004 | Available |