Machine vision applications in industrial inspection V [electronic resource] : 10-11 February, 1997, San Jose, California / A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
|---|---|
| Corporate Authors: | , , |
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©1997.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 3029. |
| Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
| Call Number: |
TS156.2 .M324 1997
|
|---|---|
| TS156.2 .M324 1997 | Available |