Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel.

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Bibliographic Details
Main Author:	Birkholz, Mario
Other Authors:	Fewster, Paul F., Genzel, Christoph
Format:	Book
Language:	English
Published:	Weinheim : Wiley-VCH, ©2006.
Subjects:	Thin films. X-ray spectroscopy.

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Call Number:	QC176.83 .B57 2006
QC176.83 .B57 2006	Available Place a Hold