Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp.
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Berlin :
Springer-Verlag,
©2006.
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| Series: | Nanoscience and technology.
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| Subjects: |
PASCAL Offsite
| Call Number: |
QH212.A78 K38 2006
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| QH212.A78 K38 2006 | Available Place a Hold |