Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman, James W. Mayer.

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Bibliographic Details
Main Author:	Alford, Terry L.
Other Authors:	Feldman, Leonard C., Mayer, James W., 1930-
Format:	Book
Language:	English
Published:	New York, N.Y. ; London : Springer, ©2007.
Subjects:	Thin films. Nanostructured materials.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	QC176.83 .A44 2007
QC176.83 .A44 2007	Available Place a Hold