Advanced environmental monitoring / edited by Young J. Kim and Ulrich Platt.

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Bibliographic Details
Corporate Author: International Symposium on Advanced Environmental Monitoring
Other Authors: Kim, Young J. (Young Joon), 1949-, Platt, Ulrich
Format: Conference Proceeding Book
Language:English
Published: Berlin : Springer Verlag, ©2008.
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Holdings details from PASCAL Offsite
Call Number: TD193 .A38 2008
TD193 .A38 2008 Available Place a Hold