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Sub-debt yield spreads as bank risk measures [microform] / Douglas D. Evanoff and Larry D. Wall.

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Bibliographic Details
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Main Author:	Evanoff, Douglas Darrell, 1951-
Corporate Author:	Federal Reserve Bank of Chicago
Other Authors:	Wall, Larry D.
Format:	Microfilm Book
Language:	English
Published:	Chicago, Ill. : Federal Reserve Bank of Chicago, 2001.
Series:	Working paper series (Federal Reserve Bank of Chicago. Research Department) ; WP-01-03. ASI microfiche library. Non-depository collection ; ASI 2001 9375-13.311.
Subjects:	Financial institutions > Econometric models. Bank capital > Evaluation > Econometric models.

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Call Number:	ASI 2001 9375-13.311
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Call Number:	ASI 2001 9375-13.311
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