Credit risk assessment considering variations in exposure : application to commitment lines / Shigeaki Fujiwara.
Commitment lines; Probability of default; Loss given default; Exposure at default; Expected loss; Unexpected loss.
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Format: | Book |
Language: | English |
Published: |
Tokyo :
Institute for Monetary and Economic Studies, Bank of Japan,
[2008]
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Series: | IMES discussion paper series ;
no. 2008-E-3. |
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Internet
Connect to online resourceNorlin Library - Basement - Government Information - Foreign
Call Number: |
674-B22M 5:2008-E3
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674-B22M 5:2008-E3 | Available Place a Hold |