Credit risk assessment considering variations in exposure : application to commitment lines / Shigeaki Fujiwara.

Commitment lines; Probability of default; Loss given default; Exposure at default; Expected loss; Unexpected loss.

Saved in:
Bibliographic Details
Online Access: Connect to online resource
Main Author: Fujiwara, Shigeaki
Corporate Author: Nihon Ginkō. Kin'yū Kenkyūjo
Format: Book
Language:English
Published: Tokyo : Institute for Monetary and Economic Studies, Bank of Japan, [2008]
Series:IMES discussion paper series ; no. 2008-E-3.
Subjects:

Internet

Connect to online resource

Norlin Library - Basement - Government Information - Foreign

Holdings details from Norlin Library - Basement - Government Information - Foreign
Call Number: 674-B22M 5:2008-E3
674-B22M 5:2008-E3 Available Place a Hold