EMLC 2008 [electronic resource] : 24th European Mask and Lithography Conference : 21-24 January 2008, Dresden, Germany / Uwe F.W. Behringer, chair/editor ; Wilhelm Maurer, Jacques Waelpoel, program chairs ; organized by VDE/VDI GMM--the Society for Microelectronics, Micro- and Precision Engineering (Germany) ; cooperating organizations, BACUS [and others]

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Authors: European Mask and Lithography Conference Dresden, Germany, VDE/VDI-Gesellschaft für Mikroelektronik, Mikro- und Feinwerktechnik, BACUS (Technical group), SPIE (Society)
Other Authors: Behringer, Uwe F. W., Maurer, Wilhelm, Waelpoel, Jacques
Other title:European Mask and Lithography Conference 2008.
24th European Mask and Lithography Conference.
SPIE digital library.
Format: Electronic Conference Proceeding eBook
Language:English
Published: Bellingham, Wash. : SPIE, ©2008.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6792.
Subjects:
Description
Physical Description:1 volume (various pagings) : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and author index.
ISBN:9780819469564
0819469564
ISSN:0277-786X ;