Flight test of a resident backup software system [microform] / Dwain A. Deets, Wilton P. Lock, and Vincent A. Megna.

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Bibliographic Details
Main Author:	Deets, Dwain A.
Corporate Author:	Dryden Flight Research Facility
Other Authors:	Lock, Wilton P., Megna, Vincent A.
Format:	Government Document Microfilm Book
Language:	English
Published:	Edwards, Calif. : National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1986.
Series:	NASA technical memorandum ; 86807.
Subjects:	Control systems design. Fault tolerance. Flight control. Flight tests. Fly by wire control. Redundancy.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.15:86807
NAS 1.15:86807	Restricted Place a Hold