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Interface characterization of XUV multilayer reflectors using HRTEM (high-resolution transmission electron microscopy) and x-ray and XUV reflectance [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Corporate Authors:	Lawrence Berkeley Laboratory (Researcher), Lawrence Berkeley National Laboratory (Researcher)
Format:	Government Document Electronic eBook
Language:	English
Published:	Washington, D.C : Oak Ridge, Tenn. : United States. Dept. of Energy. Office of Energy Research ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1990.
Subjects:	Ultraviolet Radiation. X-ray Diffraction. Deposition. Scattering. Diffraction. Electron Microscopy. Films. Surface Coating. Thin Films. Electromagnetic Radiation. Coherent Scattering. Topography. Diffusion. Radiations. Reflective Coatings. Extreme Ultraviolet Radiation. Coatings. Transmission Electron Microscopy. Interfaces. Microscopy. Condensed Matter Physics, Superconductivity And Superfluidity.

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Call Number:	E 1.99: conf-900756--54
E 1.99: conf-900756--54	Available