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Background modelling in Rietveld analysis [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Corporate Author:	Argonne National Laboratory (Researcher)
Format:	Government Document Electronic eBook
Language:	English
Published:	Washington, D.C. : Oak Ridge, Tenn. : United States. Dept. of Defense ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1989.
Subjects:	Phosphates. Transformations. Scattering. Silicon Oxides. Functions. Oxide Minerals. Neutron Diffraction. Adsorbents. Oxygen Compounds. Integral Transformations. Minerals. Correlation Functions. Molecular Sieves. Corrections. Lattice Parameters. Data Analysis. Distance. Aluminium Phosphates. Diffraction. Crystallography. Peaks. Amorphous State. Fourier Transformation. Aluminium Compounds. Quartz. Silicon Compounds. Coherent Scattering. Bragg Reflection. Phosphorus Compounds. Interatomic Distances. Reflection. Crystals. Oxides. Chalcogenides. Inorganic, Organic, Physical And Analytical Chemistry.

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Call Number:	E 1.99: conf-8906324--2
E 1.99: conf-8906324--2	Available